The Zeiss GeminiSEM 300 can perform Inlens secondary electron imaging and backscattered electron imaging simultaneously with a resolution of up to 0.7nm. It can realize fast, high-quality, distortion-free large-scale and sub-nano resolution imaging. The EDS detector with a 100 mm2 window can perform real-time quantitative determination of point, line, and area elements. The EBSD detector can collect distortion-free and megapixel-resolution EBSPs for detailed strain and phase analysis.

The Spectro Arcos ICP-OES has a vertical double observation structure (DSOI) that increases sensitivity and eliminates contamination/matrix compatibility issues. Its ORCA optical system can capture spectra in the 130-770 nm range. Compared to Echelle-based systems with cross-dispersion using a middle step grating and prism, it delivers performance in the UV/VUV range with photoacoustic signal intensity ranging up to 5x more.

The SPECTROLAB S features the world’s CMOS-based detector recording system, making it ideal for high-end metal analysis. It provides extremely fast, highly accurate, and exceptionally flexible analysis for applications ranging from trace elements to multi-matrix.

The Jena novAA 800F features an integrated carousel with an RFID reader for 8 coded hollow cathode lamps, deuterium background correction, a proven optical bench in single and double beam mode as well as in emission mode, and the latest SiOSens solid-state detector. Its multiple intelligent accessories maximize productivity, safety, and ease of use for analytical routines.

The 68TM-30 universal material testing system has 30kN and 1kN load sensors with an accuracy of 0.5 grade in the range of 0.1 ~ 100%. The test system can perform integrated data closed-loop control and acquisition, as well as automatic identification and calibration of sensors. Its high-precision non-contacting video extensometer AVE2 has a resolution of 0.5μm and uses a patented cross-polarized lighting system and CDAT fans to eliminate the influence of personnel, lighting, and airflow on the test results for highly repeatable and accurate strain measurement.

The VR-5200 project uses striped structured light and a high-precision CMOS sensor to capture images and measure the height and position of each point. Equipped with a low-power lens, it can measure ranges up to 200×100×50 mm. The high-magnification lens reduces the display resolution to 0.1μm, allowing for non-contact batch measurement of shape, fluctuation, and roughness. 

The IM-8020 uses a dual telecentric lens with exceptional edge detection capabilities to measure samples of varying heights with just one click. Its detection performance is 3 times that of conventional models thanks to its 20-megapixel CMOS and new edge detection algorithm. With a measurement area of 300 mm × 200 mm and twice the speed of traditional models, it can measure up to 300 parts in just a few seconds. This allows for fast, accurate, and easy measurements, greatly improving accuracy while reducing measurement time and human error.

The HELOS/BR laser particle analyzer is equipped with a powerful and robust RODOS dry dispersion unit for fast and repeatable particle size analysis of dry samples. It has a measuring range of 0.3 to 175μm and an accuracy of less than 0.3%.

The STA 449F3 Jupiter is a robust, flexible and easy-to-use instrument that simultaneously determines calorie effects and mass variation. It combines a high-performance Heat-Flux DSC with a thermobalance that has microgram-resolution, offering an unmatched sample load and measurement range.